Unit for analysis of small molecules
Unit for analysis of small molecules provides support to all researches in microstructural and morphological examination of solid materials as well as in structural study of crystalline materials. The electron microscope, installed within this unit, enables analysis of solid surfaces in nanometre-scale either in the field of material science (metallic samples, alloys, ceramic samples, minerals, polymers, composites, etc.) or in the field of biotechnology (tissue samples, cells, etc.). The equipment for X-ray diffraction, installed within this unit, provides support in structural analysis of crystalline solids. Besides crystalline structure, molecular structure may also be undoubtedly determined for molecular species thus providing essential information about the investigated system. X-ray powder diffraction system, installed within this unit, enables high quality qualitative and quantitative phase analysis of solid samples.
Head:
prof. dr. Marinšek Marjan, Full Professor
Reseach equipments:
Equipment name:
Total organic carbon analyzer Shimadzu TOC-L
Person, responsible for the equipment: doc. dr. Lev Matoh
Purpose of the equipment:
- The Shimadzu Total Organic Carbon analyzer TOC-L can be used to determine total carbon, inorganic carbon, and totalorganic carbon in water.
- It enables the oxidation of both simple and difficult-to-break-down organic molecules.
- It has a wide measuring range, 50 µg/L - 30,000 mg/L.
- Additionally, there is a module for analyzing solid samples.
Accessibility:
As agreed with the person, responsible for the equipment.
Equipment name:
Field Emission Scanning Electron Microscope ThermoScientific Apreo 2
Person, responsible for the equipment: doc. dr. Tina Skalar
Purpose of the equipment:
Field Emission Scanning Electron Microscope (FE-SEM) TermoScientific Apreo 2 enables high-quality analysis of virtually all solid, non-volatile samples, down to the nano range, in the fields of materials science (research of metals, alloys, ceramics, minerals, polymers, composites, etc.) and biotechnology (research of tissues, cells, etc.). The microscope enables analysis of microstructures, morphology, and elemental microanalysis. The microscope equipment includes:
- Schottky type thermal field emission source,
- Two secondary electron detectors within the lens,
- Everhart-Thornley secondary electron detector,
- Current absorbed detector,
- Secondary electron detector for variable pressure observation,
- High-resolution backscattered electron detector, which enables Z-contrast and topographical contrast (EBSD),
- STEM detector and
- Energy-dispersive spectrometer (EDS).
Additionally, there is an ion mill that allows for the preparation of cross-sections and polishing of samples.
Accessibility:
As agreed with the person, responsible for the equipment or through the online reservation system:
MICROSCOPE RESERVATION
Interested users should contact the unit manager who organizes the measurements. The cost of measurements depends on the nature of the sample, the complexity of the experiments, and the interpretation of the data. You can get the price information from the person, responsible for the equipment when you make an appointment for the experiments.
Equipment:
Single Crystal X-Ray Diffractometer Nonius Kappa CCD
Person, responsible for the equipment:
dr. Andrej Pevec, Assistant Professor
+386 1 479 8527
Purpose of the equipment:
- Single Crystal X-Ray Diffractometer Nonius Kappa CCD is equipped with molybdenum X-ray tube (MoKα, 0.71072 Å) and CCD detector (90 mm).
- The diffractometer is equipped with cryostat Oxford Cryosystem 700 for Liquid Nitrogen. Thus, the diffraction data collection of single crystals is possible in a temperature range between 100 K and ambient temperature.
- It enables the structural analysis of small molecules.
- Face- indexing and orientation of single crystal is also possible.
- From the diffraction data, a structural analysis is possible yielding the publishable results.
Interested users should contact the unit manager who organizes the measurements. The cost of measurements depends on the nature of the sample, the complexity of the experiments, and the interpretation of the data. You can get the price information from the person, responsible for the equipment when you make an appointment for the experiments.
Equipment name:
Single Crystal X-Ray Diffractometer Agilent SuperNova
Person, responsible for the equipment:
dr. Amalija Golobič, Associate Professor
+386 1 479 8521
Purpose of the equipment:
- Single Crystal X-Ray Diffractometer Agilent SUperNova is equipped with two microfocus sources, i.e. molybdenum X-ray tube (MoKα, 0.71072 Å) and copper (CuKα, 1.54184 Å), and Atlas CCD detector (135 mm).
- Diffractometer is equipped with Liquid Nitrogen Cryojet (Oxford Instruments). Thus, the diffraction data collection of single crystals is possible in a temperature range between 100 K and ambient temperature.
- It enables the structural analysis of small molecules as well as macromolecules.
- A simulation of powder pattern can be obtained by a diffraction on single crystal.
- Face-indexing and orientation of single crystal is also possible.
- From the diffraction data, a structural analysis is possible yielding the publishable results.
Accessibility:
As agreed with the person, responsible for the equipment.
Interested users should contact the unit manager who organizes the measurements. The cost of measurements depends on the nature of the sample, the complexity of the experiments, and the interpretation of the data. You can get the price information from the person, responsible for the equipment when you make an appointment for the experiments.
Equipment name:
Coupled system for thermal analysis: thermogravimetry – gas storage interface – gas chromatography/mass spectrometry; Mettler Toledo TGA/DSC3+ – IST16 – GC/MS
Person, responsible for the equipment:
Prof. dr. Romana Cerc Korošec
Operator:
Doc. dr. Nataša Čelan Korošin
Purpose of the equipment:
Coupled system for thermal analysis: thermogravimetry – gas storage interface – gas chromatography/mass spectrometry (Mettler Toledo TGA/DSC3+ – IST16 – GC/MS) is equipped with:
1) Mettler Toledo Thermoanalyser TGA/DSC3+, which, in addition to measuring mass changes, enables detection of enthalpy changes in the sample during heating. The temperature range is 25 to 1500 °C. An auto-sampler with 34 positions allows automatic sample change. During analysis, the furnace can be purged with one of the selected gases: argon, nitrogen, air, oxygen, a mixture of argon/hydrogen, ammonia, helium, or carbon dioxide.
2) Gas storage interface IST 16 (Setaram), which enables collection of up to 16 gas samples evolved during different stages of thermal decomposition.
3) Gas chromatography analyser with ion-selective detector (Agilent) for analysis of each collected gas sample. This instrument enables separation of the individual components and their further analysis with a mass spectrometer. Analysis of the collected gas samples is performed after thermogravimetric measurements.
The configuration of the coupled system enables high-quality analysis of complex thermal decompositions together with analysis of the evolved gases, as well as the evaluation and preparation of the analysed data for publication.
Accessibility:
As agreed with the person, responsible for the equipment or the operator.
Equipment name:
Quroum Q150T ES – turbo pumped high resolution sputter coater for FEG-SEM
Person, responsible for the equipment:
doc. dr. Tina Skalar,
+386 1 479 8587
Purpose of the equipment:
- Q150T ES is equipped with high vacuum turbo pumping system which allows sputtering of a wide range of oxidising, non-oxidising metals and carbon coating – suitable for SEM, high resolution FE-SEM purposes, TEM and many thin-film applications.
- Q150T ES is equipped with a vacuum system with a two-stage oil-sealed rotary pump and a TMP – turbomolecular pump, a vacuum gauge, and an automatic operation system.
- Standard target is Cr, but the following can also be used:
Au, Au/Pd, Pt, Pt/Pd, W, Al, C, Fe, Ir, Co, TIN, Mo, Mg, Ta, Cu, Ag, Ni … - Q150T ES allows precise thickness control using the film thickness monitor.
- Q150T ES has a fully automatic touch screen control. It allows multiple, customer defined coating schedules (protocols can be stored).
Accessibility:
As agreed with the person, responsible for the equipment.
Equipment name:
Flexiwave Microwave Synthesis System
Person, responsible for the equipment: prof. dr. Romana Cerc Korošec
Purpose of the equipment:
Synthesis of nanoparticles or compounds, sintering of solid particles.
Accessibility:
As agreed with the person, responsible for the equipment.
Interested users should contact the unit manager who organizes the measurements. The cost of measurements depends on the nature of the sample, the complexity of the experiments, and the interpretation of the data. You can get the price information from the person, responsible for the equipment when you make an appointment for the experiments.
Equipment name:
The CrystalBreeder Crystallizer
Person, responsible for the equipment: prof. dr. Anton Meden
Operator: doc. dr. Jakob Kljun
Purpose of the equipment:
The CrystalBreeder crystallizer contains 32 microreactors with a mixing system for reaction mixtures and a working volume of up to 250 microlitres, set in 8 thermostated chambers. The device enables the crystallization of small molecules using three different techniques: Thermostats allow for the execution of crystallization experiments with temperature programs in the range between -15 and 150 °C with temperature measurement accuracy of up to 0.1 degrees. Through the solvent evaporation module and vacuum pump, it is possible to perform crystallization.
Accessibility:
As agreed with the operator or the person, responsible for the equipment.
Equipment:
Electrokinetic Analyzer for Solid Surface Analysis
Person, responsible for the equipment:
znan sod. dr. Andraž Šuligoj
Purpose of the equipment:
Determination of the zeta potential (ZP) at the surface of solid (planar) samples. Measurement of ZP of macro particles (>25 µm). Monitoring of adsorption and desorption kinetics on the surface of solids (response time: 200 ms).
Accessibility:
As agreed with the person, responsible for the equipment.
Equipment name:
FTIR Microscope Bruker Lumos II
Person, responsible for the equipment: doc. dr. Ula Putar
Purpose of the equipment:
The Bruker Lumos II FTIR microscope is a standalone FTIR imaging microscope with high-performance in any measurement mode (transmission, reflection or ATR). The FTIR microscope includes three detectors: a conventional liquid nitrogen-cooled MCT detector, a thermoelectrically cooled MCT detector, and an FPA (Focal Plane Array) detector, which significantly reduces analysis time due to its performance.
The Lumos II FTIR microscope allows for the analysis of samples of various sizes and also enables the direct placement of larger samples on the stage. The ATR crystal is motorized, which allows constant pressure on the examined surface, making it easier to compare spectra.
The device enables a wide range of applications, such as analysis and identification of coatings, microplastics, and variousother polymers, applications in art and cultural heritage, the pharmaceutical industry, tissue painting, and analysis of diamonds and other stones.
In addition to the device and the Opus software, the Purency Microplastics Finder program is also available, which is specifically designed for detecting microplastics.
Accessibility:
As agreed with the person, responsible for the equipment.
Equipment name:
Scanning field emission electron microscope (FE-SEM)
Person responsible for the equipment: prof. dr. Marjan Marinšek
Purpose of the equipment:
The field emission electron microscope (FE-SEM) TermoScientific Apreo 2 enables high-quality analysis of practically all non-volatile solid samples, down to the nano range, both in the field of materials science (research of metals, alloys, ceramics, minerals, polymers, composites, etc.) as well as in research in the field of biotechnology (tissue, cell research, etc.). The microscope enables the analysis of microstructures, morphology and elemental microanalysis.
Microscope equipment includes:
- Schottky thermal source of electrons with field emission,
- Two secondary electron detectors inside the lens,
- Everhart-Thornley secondary electron detector,
- Absorbed current detector,
- Secondary electron detector for observation in variable pressure mode,
- High-resolution detector of backscattered electrons, which enables Z-contrast and topographic contrast (EBSD),
- STEM detector and
- Energy dispersive spectrometer (EDS).
Additionally, an ion mill is also available, which enables cross-section preparation and sample polishing.
Accessibility:
Trained operators can book work on the equipment through the person responsible for the equipment or through the online booking system:
fkktportal.uni-lj.si/KMPI/_layouts/15/start.aspx
The interested user (untrained operator) contacts the person responsible for the equipment, who organizes the performance of the measurements. The price of the measurements depends on the nature of the sample, the complexity of the experiments and the interpretation of the data. One can get price information from the administrator when you make an appointment for measurements.
Equipment name:
3D electron diffractometer XtaLAB Synergy-ED
Person, responsible for the equipment: doc. dr. Jakob Kljun, doc. dr. Marta Počkaj
Purpose of the equipment:
3D electron diffractometer XtaLAB Synergy-ED is equipped with electron gun with LaB6 filament (electron energy up to 200 keV), three-stage electron-optical condenser system and high-sensitivity hybrid pixel array detector, HyPix-ED, as well as with goniometer with single rotation axis with 160 ° total range. The instrument enables the ultra-low-dose diffraction data collection of different crystalline materials (e.g. MOFs, macromolecules, ceramics etc.). Cryo-transfer and low temperature measurement is also possible. An EDS analyzer is also attached enabling elemental analysis. From the diffraction data, a structural analysis is possible yielding the publishable results.
Accessibility:
As agreed with the person, responsible for the equipment.
Equipment name:
Thermal analysis system: Mettler Toledo TGA/DSC3+ in Mettler Toledo DSC5+
Person responsible for the equipment: doc. dr. Nataša Čelan Korošin
Operator: doc. dr. Nataša Čelan Korošin and prof. dr. Romana Cerc Korošec
Purpose of the equipment:
"The TGA/DSC3+ thermal analyser combines two different thermal analysis techniques that provide complementary information on the thermal properties of a sample. Thermogravimetric analysis (TGA) measures the change in mass of a sample when exposed to a controlled heating or cooling programme (25–1600 °C) and atmosphere (Ar, N2, air, O2, He, CO2, Ar/H2). Differential scanning calorimetry (DSC) simultaneously measures enthalpy changes (melting, solidification, crystallization, transitions between polymorphic modifications) or the change in heat capacity (glass transition). The system allows coupling with an MS or FTIR spectrometer for evolved gas analysis (EGA).
The DSC5+ analyser contains a sensor with 136 thermocouples and operates in a temperature range from –150 °C to 700 °C. It provides two different measurement modes: power compensation for excellent resolution of close-lying effects, and heat flux mode, which, due to its low noise level, enables measurements of samples that require a high level of sensitivity for detecting weak effects or transitions. The system is robotic, with an inert gas-purged crucible chamber to protect the samples from the environment."
Accessibility:
As agreed with the person responsible for the equipment or the operators.
Equipment name:
High-resolution X-ray powder diffractometer
Person, responsible for the equipment: prof. dr. Anton Meden
Purpose of the equipment:
The instrument is equipped with a primary monochromator (pure CuKα1 radiation) and a position-sensitive detector. It allows recording in reflection and transmission (foil and capillary) modes.
Accessibility:
Interested users should contact the equipment manager who organizes the measurements. The price depends on the sample type, experiment complexity, and data interpretation. The manager will provide pricing information when you agree to proceed with the experiments.